01 Security validation
Short-circuit testing allows you to evaluate the performance of power devices under extreme conditions to ensure that they can maintain the necessary safety performance in the event of a short-circuit fault and avoid system failures or safety incidents caused by device damage.

2 Performance evaluation
Short-circuit testing can help measure short-circuit losses in power semiconductors, i.e., the amount of energy consumed by a device under short-circuit conditions, which is critical for understanding the thermal management design and cooling needs of a device.

3 Reliability qualification
Data such as short-circuit current handling capability, withstand time, and temperature changes observed during testing are important indicators of long-term reliability and longevity of the device.

4 Product selection and design optimization
The results of the short-circuit test can be used by the design engineer to select the most suitable power device for the application, or to optimize the circuit design based on the test feedback to ensure that the system can operate stably in various operating conditions.

5 quality control
Utilizing short-circuit testing as part of the quality control of SiC devices ensures that each device produced meets established short-circuit tolerance standards and meets industry specifications and customer requirements.

1 Set up a test environment
The short-circuit test case of SiC MOSFET power device introduced this time is a short-circuit test platform built based on Firstack's SiC MOSFET dynamic test equipment ME300D, silicon carbide gate driver 2FSD0420T17D1C, low-inductance busbar capacitor cell, and SiC power BSM250D17P2E004 device under test.

2 Test conditions
Test voltage condition: 600V, short circuit pulse time: 1.2μs

3 Testing process

ME300D

Test environment