- Semiconductor Test
- Application Testing
- Reliability Test
- Mass production Test
Application Testing
ME300D has the characteristics of high accuracy, high efficiency and high intelligence. Its test voltage is 6000V, current is 10000A, and parasitic inductance is less than 10nH. It was rated as the first equipment in Zhejiang Province.
Reliability Test
ME100DHTXB can be equipped with DGB/DRB aging cabinet in the same system to realize three functions: DHTGB, DHTRB, and DHTGB+DHTRB. The FS can reach 500kHz, the DGB du/dt (Vgs) can reach 1.5V/ns, and the DRB du/dt (Vds) can reach 80V/ns.
Mass production Test
ME100DS-PIM is specially designed for mass production testing of SiC devices. It has a built-in proprietary short-circuit protection device with a short-circuit current of 12000A, a short-circuit protection time of <1.5μs, and a parasitic inductance of <15nH.